Delamination-and Electromigration-Related Failures in Solar Panels—A Review

A Statistical Model for Electromigration Failures

The lognormal has been traditionally used to model the failure time distribution of electromigration failures. However, when used to estimate the failure of large metal layers, it leads to a clear disagreement with established empirical data. To resolve this problem, we propose to use a shifted lognormal (SLN) as a better model of the failure time of individual wires. We will show that the SLN ...

Electromigration-induced extrusion failures in Cu/low-k interconnects

Frank L. Wei, Chee Lip Gan, Tam Lyn Tan, Christine S. Hau-Riege, Amit P. Marathe, Joost J. Vlassak, and Carl V. Thompson Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave., 13-5142, Cambridge, Massachusetts 02139, USA School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Ave., Singapore 639798, Singap...

An investigation of cognitive failures and its related factors in industry employees in Qom Province, Iran, in 2016

Background: Cognitive failure is mental lapses in perception, attention, memory, and action. It occurs during routine tasks that one would usually have no difficulty in successfully completing. Cognitive performance is influenced by conditions and some individual and job characteristics and the identification of factors that affect human performance is essential to prevent human error. The purp...

review of radiographic methods in dental implantology

چکیده ندارد.

Endodontic Failures - A Review